analytical axis ultra delay line detector dld instrument Search Results


axis ultra dld photoelectron spectrometer  (Kratos Solutions)
86
Kratos Solutions axis ultra dld photoelectron spectrometer
Axis Ultra Dld Photoelectron Spectrometer, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/pm31960675__nl9b04622_si_001-46-10-15?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
axis ultra dld photoelectron spectrometer - by Bioz Stars, 2026-08
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xps axis ultra dld  (Kratos Solutions)
86
Kratos Solutions xps axis ultra dld
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Xps Axis Ultra Dld, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/10__1002_slash_idm2__12079-172-7-11?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
xps axis ultra dld - by Bioz Stars, 2026-08
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axis ultra dld xps  (Kratos Solutions)
86
Kratos Solutions axis ultra dld xps
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Axis Ultra Dld Xps, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/10__1002_slash_aesr__202500150-183-14-18?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
axis ultra dld xps - by Bioz Stars, 2026-08
86/100 stars
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analytical axis ultra dld machine  (Kratos Solutions)
86
Kratos Solutions analytical axis ultra dld machine
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Analytical Axis Ultra Dld Machine, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/deshpande_aditya__2022__synthesis_and_customization_of_transition_metal_dichalcogenides-185-28-27?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
analytical axis ultra dld machine - by Bioz Stars, 2026-08
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analytical axis ultra dld x ray photoelectron spectrometer  (Kratos Solutions)
86
Kratos Solutions analytical axis ultra dld x ray photoelectron spectrometer
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Analytical Axis Ultra Dld X Ray Photoelectron Spectrometer, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/pm42280950-114-7-13?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
analytical axis ultra dld x ray photoelectron spectrometer - by Bioz Stars, 2026-08
86/100 stars
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surface analyzer  (Kratos Solutions)
86
Kratos Solutions surface analyzer
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Surface Analyzer, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/pmc04745080-14-9-11?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
surface analyzer - by Bioz Stars, 2026-08
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k alpha  (Kratos Solutions)
86
Kratos Solutions k alpha
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
K Alpha, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/10__4314_slash_bcse__v39i6__2-80-7-14?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
k alpha - by Bioz Stars, 2026-08
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delay line detector dld spectrometer  (Kratos Solutions)
86
Kratos Solutions delay line detector dld spectrometer
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Delay Line Detector Dld Spectrometer, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/pmc12809353-67-7-11?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
delay line detector dld spectrometer - by Bioz Stars, 2026-08
86/100 stars
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kα radiation  (Kratos Solutions)
86
Kratos Solutions kα radiation
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Kα Radiation, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/10__3390_slash_chemosensors11010059-80-16-19?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
kα radiation - by Bioz Stars, 2026-08
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axis ultra dld surface analysis instrument  (Kratos Solutions)
86
Kratos Solutions axis ultra dld surface analysis instrument
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Axis Ultra Dld Surface Analysis Instrument, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/pm23986151-171-8-7?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
axis ultra dld surface analysis instrument - by Bioz Stars, 2026-08
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spectrometer  (Kratos Solutions)
86
Kratos Solutions spectrometer
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Spectrometer, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/10__1016_slash_j__susmat__2024__e01006-55-13-14?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
spectrometer - by Bioz Stars, 2026-08
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axis ultra dld hemispherical electron analyzer  (Kratos Solutions)
86
Kratos Solutions axis ultra dld hemispherical electron analyzer
FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet <t>photoelectron</t> <t>spectroscopy.</t>
Axis Ultra Dld Hemispherical Electron Analyzer, supplied by Kratos Solutions, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/analytical+axis+ultra+delay+line+detector+dld+instrument/jaquez_nunez_maribel__2019__bandgap_engineering_of_zinc_oxide_sulfide_and_gallium_oxide_sulfide_highly_mismatched_alloys-391-18-17?v=Kratos+Solutions
Average 86 stars, based on 1 article reviews
axis ultra dld hemispherical electron analyzer - by Bioz Stars, 2026-08
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Image Search Results


FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet photoelectron spectroscopy.

Journal: Interdisciplinary Materials

Article Title: Stress compensation based on interfacial nanostructures for stable perovskite solar cells

doi: 10.1002/idm2.12079

Figure Lengend Snippet: FIGURE 3 Carrier dynamics and nonradiative recombination energy loss analysis. (A) Work function (left) and valence band (right) for spin SnO2, sprayed SnO2 (SP‐SnO2) and Rb2CO3 treated SP‐SnO2 ETLs measured by UPS. Black vertical lines represent the energy difference of EV relative to EF. (B) Schematic of energy band alignment for spin SnO2, SP‐SnO2, and Rb2CO3 treated SP‐SnO2 with perovskite. (C, E) Surface potential images of perovskite/ETL (SP‐SnO2 and Rb2CO3 treated SP‐SnO2)/ITO sample by KPFM measurements in dark and illuminating conditions, respectively. (D, F) Contact potential differences (CPDs) distribution histograms of SP‐SnO2 and Rb2CO3 treated SP‐SnO2 under dark and illumination conditions, respectively. (G) TPV decay curves for perovskite solar cells with and without Rb2CO3 treated. (H) EIS curves for PSCs with different SnO2 layers. EIS, electrochemical impedance spectroscopy; ETL, electron transport layer; ITO, indium tin oxide; KPFM, Kelvin probe force microscopy; PSC, perovskite solar cell; PVSK, perovskite; SC, spin‐coated; SPV, surface potential difference; TPV, transient photovoltage; UPS, ultraviolet photoelectron spectroscopy.

Article Snippet: UPS measurements were carried out on an XPS AXIS Ultra DLD (Kratos Analytical).

Techniques: Impedance Spectroscopy, Microscopy, Spectroscopy